The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Aug. 10, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Juho Jeon, Bucheon-si, KR;

Hun-dae Choi, Seoul, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); H01L 25/065 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 7/1057 (2013.01); G11C 29/025 (2013.01); G11C 29/028 (2013.01); H01L 25/0657 (2013.01);
Abstract

A memory device configured to perform a ZQ calibration method may include a first die and a second die that share a resistor connected to a ZQ pin. The first die may be configured to perform a first calibration operation using the resistor in response to a ZQ calibration command applied from outside of the memory device. The first die may be configured to generate a ZQ flag signal after the first calibration operation ends and perform a second calibration operation. The second die may be configured to perform the first calibration operation in response to the ZQ flag signal and perform a second calibration after the first calibration operation of the second die ends.


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