The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Apr. 24, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kevin B. Judd, Tucson, AZ (US);

Ernest S. Gale, Tucson, AZ (US);

Randy C. Inch, Tucson, AZ (US);

Eiji Ogura, Yokohama, JP;

Kazuhiro Tsuruta, Tokyo, JP;

Pamela R. Nylander-Hill, Tucson, AZ (US);

Tsuyoshi Miyamura, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 15/093 (2006.01); G11B 15/43 (2006.01); G11B 5/55 (2006.01);
U.S. Cl.
CPC ...
G11B 15/43 (2013.01); G11B 5/5539 (2013.01);
Abstract

A tape drive-implemented method, according to one embodiment, includes: detecting a read error, determining whether a current tension setting of the magnetic tape is accurate, determining whether the read error is part of an error burst in response to determining that the current tension setting of the magnetic tape is accurate, sending instructions to perform a first re-read attempt in response to determining that the read error is not part of an error burst, determining whether the first re-read attempt was performed successfully, selecting a range of tension settings in response to determining that the first re-read attempt was not performed successfully, selecting a range of lateral offsets, sending instructions to apply each unique combination of tension settings and lateral offsets, for each of the unique combinations applied, sending instructions to perform a second phase re-read attempt, and determining whether the second phase re-read attempt was performed successfully.


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