The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Jun. 29, 2016
Applicant:
Mediatek Inc., Hsin-Chu, TW;
Inventors:
Chun-Chia Chen, Hsinchu, TW;
Liang-Che Sun, Taipei, TW;
Assignee:
MEDIATEK INC., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/6267 (2013.01); G06K 2209/17 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20004 (2013.01); G06T 2207/30128 (2013.01); G06T 2207/30132 (2013.01);
Abstract
An object analyzing method applied to an object analyzing system. The object analyzing method comprises: (a) applying at least one analyzing parameter extracting process according to an object type for an target object, to extract at least one analyzing parameter for the target object; (b) selecting least one analyzing model according to the object type; and (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result.