The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Sep. 14, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Bernhard Johannes Brendel, Norderstedt, DE;
Gilad Shechter, Haifa, IL;
Liran Goshen, Pardes-Hanna, IL;
Thomas Koehler, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to an X-ray imaging device () for an object, an X-ray imaging system () for an object, an X-ray imaging method for an object, and a computer program element for controlling such device or system and a computer readable medium having stored such computer program element. The X-ray imaging device () comprises a receiving unit () and a processing unit (). The receiving unit () is configured to receive attenuation data representing attenuation properties of the object for at least two different X-ray spectra. The processing unit () is configured to decompose the attenuation data into decomposed data, to reduce noise in the decomposed data to obtain de-noised data, to back-convert the de-noised data into back-converted attenuation data, to combine back-converted attenuation data and the attenuation data into combined attenuation data, and to decompose the combined attenuation data into combined decomposed data.