The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Jul. 06, 2017
Applicant:
Agrian, Inc., Clovis, CA (US);
Inventor:
Aaron Dale Hunt, Bellefonte, PA (US);
Assignee:
AGRIAN, INC., Clovis, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06Q 50/02 (2012.01); G06N 5/04 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06375 (2013.01); G06Q 50/02 (2013.01); G06N 5/045 (2013.01); G06N 7/005 (2013.01); Y02A 40/12 (2018.01);
Abstract
A multi-year yield analysis in precision agriculture characterizes variables affecting crop yield to enable site-specific prescription mapping for a bounded field. Remotely-sensed imagery of the bounded field is incorporated as a replacement for, or in addition to, one or more of coverage data, uniformity data, age data, and weather data that comprise variables in the multi-year yield analysis. The multi-year yield analysis enables recommendations for variable-rate applications to the bounded field such as seeding, fertilizing, and applying crop treatments.