The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Nov. 13, 2016
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Satoshi Naito, Kanagawa-ken, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G21K 1/00 (2006.01); G06K 9/03 (2006.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/0053 (2013.01); G06K 9/00503 (2013.01); G06K 9/00543 (2013.01); G06K 9/036 (2013.01); G06K 9/4642 (2013.01); G06K 9/4652 (2013.01); G06K 9/522 (2013.01); G06T 7/0002 (2013.01); G06K 2209/05 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30168 (2013.01);
Abstract
An image obtaining section obtains a radiation image that includes a periodic pattern of a grid. A frequency analyzing section performs frequency analysis on the radiation image to obtain a frequency spectrum of the radiation image. A peak determining section determines a peak within the frequency spectrum to be a target of processing. A first judging section measures the width of the peak which is the target of processing, and judges the quality of the grid based on the measured width of the peak.