The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Mar. 27, 2012
Applicants:
Alan Williams, Albany, CA (US);
Simon Cawley, Oakland, CA (US);
John E. Blume, Bellingham, WA (US);
Hui Wang, San Bruno, CA (US);
Tyson Clark, San Jose, CA (US);
Inventors:
Alan Williams, Albany, CA (US);
Simon Cawley, Oakland, CA (US);
John E. Blume, Bellingham, WA (US);
Hui Wang, San Bruno, CA (US);
Tyson Clark, San Jose, CA (US);
Assignee:
Affymetrix, Inc., Carlsbad, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/20 (2011.01);
U.S. Cl.
CPC ...
G06F 19/20 (2013.01);
Abstract
Methods and software products for analysis of alternative splicing are disclosed. In general the methods involve normalizing probe set or exon intensity to an expression level measurement of the gene. The methods may be used to identify tissue-specific alternative splicing events.