The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Sep. 27, 2013
Applicant:
Cornell University, Ithaca, NY (US);
Inventors:
Ishanu Chattopadhyay, Ithaca, NY (US);
Hod Lipson, Ithaca, NY (US);
Assignee:
Cornell University, Ithaca, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30539 (2013.01); G06F 17/18 (2013.01); G06F 17/30622 (2013.01); G06F 17/30864 (2013.01); G06K 9/00496 (2013.01); G06K 9/6201 (2013.01);
Abstract
Data processing including a universal metric to quantify and estimate the similarity and dissimilarity between data sets. Data streams are perfectly annihilated by a correct realization of their anti-streams. Any deviation of the collision product from a baseline, for example flat white noise, quantifies statistical dissimilarity. The invention relates generally to data mining. More specifically, the invention relates to the analysis of data using a universal metric to quantify and estimate the similarity and dissimilarity between sets of data.