The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Jun. 06, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Laura J. Bennett, San Francisco, CA (US);

Lakshminarayanan Krishnamurthy, Round Rock, TX (US);

Niyati Parameswaran, Mountain View, CA (US);

Sridhar Sudarsan, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06N 99/00 (2019.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/2775 (2013.01); G06F 17/27 (2013.01); G06F 17/271 (2013.01); G06F 17/2785 (2013.01); G06F 17/30401 (2013.01); G06N 99/005 (2013.01);
Abstract

A method is disclosed for identifying paraphrases in a natural language processing (NLP) system comprising: receiving a first phrase and a second phrase by a system; analyzing the first phrase and the second phrase to provide a semantic and structural hierarchical comparison assessment, the semantic and structural hierarchical comparison assessment having an associated semantic and structural hierarchical comparison assessment value; and determining whether the semantic and structural hierarchical comparison assessment value exceeds a predetermined paraphrase equivalency criteria; and, responsive to determining the semantic and structural hierarchical comparison assessment value exceeds the predetermined paraphrase equivalency criteria, classifying the second phrase as being a rewording of the first phrase.


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