The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Feb. 06, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Thomas W. Conti, Poughkeepsie, NY (US);

Michael E. Gildein, II, Wappinger Falls, NY (US);

Kyle R. Moser, Stone Ridge, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3668 (2013.01); G06F 11/302 (2013.01); G06F 11/3452 (2013.01); G06F 11/3688 (2013.01);
Abstract

Aspects of the present invention include a method, system and computer program product. The method includes obtaining, by a processor, customer data relating to a software workload environment of a customer, and obtaining, by the processor, test data relating to a test of a software system. The method also includes comparing, by the processor, the obtained customer data with the obtained test data to determine one or more statistical measures between the obtained customer data and the obtained test data, and displaying, by the processor, the determined one or more statistical measures between the obtained customer data and the obtained test data. The method further includes wherein the customer data contains multiple data points arranged in groups of analysis points, and wherein the test data contains multiple data points arranged in groups of analysis points.


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