The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Mar. 21, 2016
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Lalatendu Patra, Bangalore, IN;

Mridhula N. Shetty, Bangalore, IN;

Rajiv Maheshwari, Redwood Shores, CA (US);

Ashwin K. Karkala, Bangalore, IN;

Sandeep Pandita, Bangalore, IN;

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0787 (2013.01);
Abstract

Techniques for running diagnostic rules across multiple nodes are disclosed. A root cause of an error occurring on a particular node is determined. A root cause of an error on the particular node is identified based on a metric corresponding to another node and/or based on a previously-reported error on another node. Additionally or alternatively, an error is predicted to occur on a particular node. The error is predicted based on a trend associated with a metric corresponding to another node.


Find Patent Forward Citations

Patra, Lalatendu. (2019). Mechanism for running diagnostic rules across multiple nodes (U.S. Patent No. 10275303). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10275303

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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