The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Feb. 02, 2018
Applicant:

Eastman Kodak Company, Rochester, NY (US);

Inventors:

Chung-Hui Kuo, Fairport, NY (US);

Mark C. Zaretsky, Rochester, NY (US);

Assignee:

EASTMAN KODAK COMPANY, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/01 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5058 (2013.01); G03G 15/01 (2013.01); G03G 15/5062 (2013.01);
Abstract

Cross-track spacing variations for a plurality of printer subsystems of an electrophotographic printing system are characterized by printing first and second test pattern and capturing image of the printed test patterns. The first and second test patterns are chosen so that the printed test patterns respond differently to cross-track spacing variations in different printer subsystems. The first and second digitized test patterns are analyzed to determine parameters that characterize an attribute of the printed test pattern as a function of cross-track position. A first defect model is used to determine estimated cross-track spacing variations for one or more printer subsystem as a function of the determined parameters.


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