The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Mar. 24, 2017
Lockheed Martin Corporation, Bethesda, MD (US);
Gregory Scott Bruce, Abington, PA (US);
Peter G. Kaup, Marlton, NJ (US);
Arul Manickam, Mount Laurel, NJ (US);
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Abstract
Magnetometers with high bandwidth acquisition of data with increased sensitivity are described herein. Increased bandwidth and sensitivity may be achieved by eliminating a reference signal for full repolarization of the magneto-optical defect center material prior to acquisition. Elimination of the reference signal eliminates the time needed to repolarize the magneto-optical defect center material and the acquisition time for the reference signal. A radiofrequency (RF) pulse sequence may be activate to apply an RF field to the magneto-optical defect center material and a magnetic field measurement may be acquired using the magneto-optical defect center material. The magnetic field measurement may be acquired independent of a reference magnetic field measurement.