The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Dec. 06, 2017
Applicant:
Cpg Technologies, Llc, Waxahachie, TX (US);
Inventors:
James F. Corum, Morgantown, WV (US);
Kenneth L. Corum, Plymouth, NH (US);
James D. Lilly, Silver Spring, MD (US);
Joseph F. Pinzone, Cornelius, NC (US);
Assignee:
CPG Technologies, Inc., Italy, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); H01P 3/00 (2006.01); H01Q 13/26 (2006.01); G01R 29/12 (2006.01); G01R 27/32 (2006.01); G01V 3/12 (2006.01); H01Q 13/20 (2006.01); H01Q 7/06 (2006.01);
U.S. Cl.
CPC ...
G01R 29/12 (2013.01); G01R 27/32 (2013.01); G01R 29/0871 (2013.01); G01R 29/0878 (2013.01); G01V 3/12 (2013.01); H01P 3/00 (2013.01); H01Q 13/20 (2013.01); H01Q 13/26 (2013.01); H01Q 7/06 (2013.01);
Abstract
Disclosed are various embodiments for adjusting an operational parameter of a guided surface waveguide probe according to measurements received from one or more measuring devices. A measuring device measures the conditions associated with an environment of the measuring device. The measuring devices communicates the measured data to the guided surface waveguide probe. Adjustments can be made to one or more operational parameters of the guided surface waveguide probe according to the measured data.