The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Feb. 01, 2017
Applicant:

Nhk Spring Co., Ltd., Yokohama-shi, Kanagawa, JP;

Inventors:

Kohei Hironaka, Kamiina-gun, JP;

Kazuya Souma, Kamiina-gun, JP;

Satoshi Shoji, Kamiina-gun, JP;

Ryosuke Yamaguchi, Kamiina-gun, JP;

Assignee:

NHK SPRING CO., LTD., Yokohama-shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 1/067 (2013.01); G01R 31/2601 (2013.01);
Abstract

Provided is a conductive probe having a first end portion and a second end portion opposing the first end portion. The first end portion includes first to fourth linear ridges and first to fifth vertexes, and the first to fourth linear ridges are spaced from one another and arranged to form a cross. The first to fourth vertexes are located on an outer circumference of the first end portion and further arranged between the first linear ridge and the second linear ridge, between the second linear ridge and the third linear ridge, between the third linear ridge and the fourth linear ridge, and between the fourth linear ridge and the first linear ridge, respectively.


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