The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Feb. 11, 2014
Charm Sciences, Inc., Lawrence, MA (US);
Robert J. Markovsky, Brentwood, NH (US);
Richard T. Skiffington, North Reading, MA (US);
Stanley E. Charm, Boston, MA (US);
Charm Sciences, Inc., Lawrence, MA (US);
Abstract
Assessing test results development during assay analysis is shown and described. In one embodiment, an apparatus generates an assessment of diagnostic test development from an assay. The apparatus may include an optical detector aligned in an optical path with the assay. Further, the optical detector may perform continuous image detection of the assay to generate an assessment testing development. In some examples, the assessment is a graphical display of diagnostic development. In yet other embodiments, a method of assessing diagnostic test development may include signaling the optical detector to perform continuing image detection of the assay and generating an assessment of said diagnostic test development. The assessment may include graphing a reflectance detected on the assay on a display board.