The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Nov. 20, 2017
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventor:

Yoshihiro Yokota, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3504 (2014.01); G01N 33/00 (2006.01); G01N 21/27 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 21/274 (2013.01); G01N 33/004 (2013.01); G01N 2021/3545 (2013.01); G01N 2021/3595 (2013.01);
Abstract

The present invention is one adapted to correct the effect of a second gas component on a first gas component in real time even when the concentration of the second gas component as a coexistent component varies every moment, and includes: a first gas analysis part adapted to measure the concentration of the first gas component contained in sample gas; a second gas analysis part adapted to measure the concentration of the second gas component contained in the sample gas; a correction coefficient storage part adapted to store a correction coefficient for correcting the effect of the second gas component on the first gas component; and a concentration correction part adapted to correct the first gas component concentration on the basis of the correction coefficient, the second gas component concentration of calibration gas used for calibrating the first gas analysis part, and the second gas component concentration.


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