The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
May. 19, 2014
Cytonome/st, Llc, Boston, MA (US);
Johnathan Charles Sharpe, Hamilton, NZ;
Emanuel Tito Mendes Machado, Merrimack, NH (US);
Rudolf Hulspas, Maynard, MA (US);
CYTONOME/ST, LLC, Bedford, MA (US);
Abstract
Systems, methods and non-transitory storage medium are disclosed herein for adjusting an output of a particle inspection system representative of a particle characteristic for a particle flowing in a flow-path of a particle processing system. More particularly, the output may be processed and a calibrated output of the particle characteristic generated. In other embodiments, one or more calibration particles are used. Thus, an output of a particle inspection system representative of a particle characteristic for one or more calibration particles flowing in a flow-path of a particle processing system may be compared relative to a standard and an action may be taken based on a result of the comparing the output to the standard.