The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
May. 02, 2018
University of Electronic Science and Technology of China, Chengdu, Sichuan, CN;
Ziji Liu, Sichuan, CN;
Shengchen Zhao, Sichuan, CN;
Zhiqing Liang, Sichuan, CN;
Hongbo Zhang, Sichuan, CN;
Tao Wang, Sichuan, CN;
Yadong Jiang, Sichuan, CN;
University of Electronic Science and Technology of China, Chengdu, Sichuan, CN;
Abstract
A system for testing thermal response time of an uncooled infrared focal plane detector array and a method therefor is provided. The system comprises: a blackbody, a chopper, a detector unit under test and a testing system. The method comprises: emitting radiation by the blackbody, chopping by the chopper, then radiating the radiation to the uncooled infrared focal plane detector array under test; generating different responses on the radiation at different chopping frequencies by the uncooled infrared focal plane detector array under test; collecting different response values of the uncooled infrared focal plane detector array under test at different chopping frequencies; obtaining response amplitude at a corresponding frequency in a frequency domain by FFT; fitting according to a formula to obtain the thermal response time.