The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Dec. 11, 2015
Applicant:

Adom, Advanced Optical Technologies Ltd., Lod, IL;

Inventors:

Yoel Arieli, Jerusalem, IL;

Yosef Weitzman, Tel-Aviv, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/447 (2006.01); G01J 3/45 (2006.01); G01J 3/28 (2006.01); G01B 11/02 (2006.01); G02F 1/1333 (2006.01); G01N 21/21 (2006.01); G01N 21/31 (2006.01); G01N 21/47 (2006.01); G01J 3/12 (2006.01); G01J 3/32 (2006.01); G01J 3/453 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/447 (2013.01); G01B 11/02 (2013.01); G01J 3/027 (2013.01); G01J 3/0224 (2013.01); G01J 3/12 (2013.01); G01J 3/2823 (2013.01); G01J 3/32 (2013.01); G01J 3/45 (2013.01); G01J 3/453 (2013.01); G01N 21/211 (2013.01); G01N 21/31 (2013.01); G01N 21/4795 (2013.01); G02F 1/13336 (2013.01); G01B 9/02 (2013.01);
Abstract

There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided.


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