The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Oct. 30, 2015
Hewlett-packard Development Company, L.p., Houston, TX (US);
Joan Singla, Barcelona, ES;
Gianni Cessel, Barcelona, ES;
Guido Charosky, Barcelona, ES;
Francesc Roure Pastor, Barcelona, ES;
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
Examples of a method for detecting misalignment cause a printer to print a calibration pattern on a recording medium sheet. The calibration pattern includes graduated measurement scales positioned so that: when the calibration pattern is printed without misalignment on a recording medium sheet of predetermined dimensions, matching graduations of plural measurement scales in the calibration pattern are printed at respective reference locations on the recording medium sheet that correspond to corners of the recording medium sheet (or to spaced positions along a line where folding of the recording medium sheet by a folding apparatus is intended to take place). When the calibration pattern is printed with misalignment on a recording medium sheet of predetermined dimensions, non-matching graduations of the plural measurement scales are printed at the reference locations on the recording medium sheet.