The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Jul. 14, 2016
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Yujie Lu, Vernon Hills, IL (US);
Yu Zou, Naperville, IL (US);
Xiaolan Wang, Buffalo Grove, IL (US);
Zhou Yu, Wilmette, IL (US);
Richard Thompson, Hawthorn Woods, IL (US);
TOSHIBA MEDICAL SYSTEMS CORPORATION, Otawara-shi, JP;
Abstract
A method and apparatus is provided to calculate scatter using a method to determine primary X-ray flux, first-scatter flux, and multiple-scatter flux using an integral formulation of a radiative transfer equation and using spherical-harmonic expansion. The integral for the primary X-ray flux does not include a spherical-harmonic expansion. The integral for the first-scatter flux includes an angle-dependent scatter cross-section. The integral for the multiple-scatter flux is performed iteratively, includes spherical harmonics, and includes a scatter cross-section expanded using Legendre polynomials. The integrals of attenuation along propagation rays can be accelerated using material decomposition of the attenuation coefficients. An anti-scatter-grid term can be included in the integrals to account for the effects of an anti-scatter grid on the fluxes prior to detection of the X-rays.