The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
Nov. 12, 2015
Prismatic Sensors Ab, Stockholm, SE;
Martin Sjolin, Stockholm, SE;
PRISMATIC SENSORS AB, Stockholm, SE;
Abstract
Disclosed is a measurement method performed by a Computed Tomography, CT, system. The CT system includes an x-ray source () and an x-ray detector () array of photon counting edge-on detectors (), wherein each photon counting edge-on detector has a number of depth-segments, also referred to as detector elements, arranged at different spatial locations in the direction of incoming x-rays (). The method includes to apply a time offset measurement scheme that provides a time offset between measurement periods for at least two different detector elements located at different depths, wherein the time offset is chosen so that at least two measurement periods at least partially overlaps in time. Disclosed is also a corresponding CT system (), a control unit for a CT system and a measurement circuit for a CT system. A computer program () controlling a CT system is also disclosed. The disclosed technology provides for a higher sampling frequency in the angular direction ().