The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Dec. 19, 2015
Applicant:
Interdigital Ce Patent Holdings, Paris, FR;
Inventors:
Pierrick Jouet, Rennes, FR;
Valter Drazic, Betton, FR;
Philippe Robert, Rennes, FR;
Benoit Vandame, Betton, FR;
Assignee:
INTERDIGITAL CE PATENT HOLDINGS, Paris, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/222 (2006.01); G06T 5/50 (2006.01); G06T 15/20 (2011.01); G06T 7/571 (2017.01); G06T 7/557 (2017.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G06T 5/50 (2013.01); G06T 7/557 (2017.01); G06T 7/571 (2017.01); G06T 15/205 (2013.01); H04N 5/222 (2013.01); H04N 5/2226 (2013.01); G06T 2200/21 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10052 (2013.01); G06T 2207/20108 (2013.01); G06T 2207/20221 (2013.01);
Abstract
A method for generating an adapted slice image from a focal stack of refocused images using an all-in-focus image derived from the focal stack comprises: selecting a slice image in the focal stack; selecting at least one object in the all-in-focus image to be focused in the adapted slice image; and generating the adapted slice image by combining the selected at least one object in the all-in-focus image onto the selected slice image.