The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Mar. 14, 2016
Applicant:

University of Notre Dame Du Lac, South Bend, IN (US);

Inventors:

Thomas G. Pratt, Niles, MI (US);

Farzad Talebi, Mishawaka, IN (US);

Assignee:

University of Notre Dame du Lac, South Bend, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/373 (2015.01); H04B 7/04 (2017.01); H04B 7/10 (2017.01); H04B 17/336 (2015.01); H04L 27/34 (2006.01); H04B 7/0413 (2017.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04B 17/373 (2015.01); H04B 7/0413 (2013.01); H04B 7/10 (2013.01); H04B 17/336 (2015.01); H04L 27/34 (2013.01); H04L 27/2636 (2013.01); H04L 27/2649 (2013.01);
Abstract

A system and method for detection of complex sinusoidal signals. The method can include obtaining a set of complex-valued samples of one or more signals, in the presence of unknown noise, using a plurality of sensors. The presence of κ candidate complex sinusoids can be assumed. Then, κ candidate complex sinusoids in the set of complex-valued samples can be estimated. The method can include comparing a measurement of the energy of the κ estimated candidate complex sinusoids with a threshold value. Based on the comparison, a determination can be made whether to assume a different number of candidate complex sinusoids and repeat the estimation and the comparison steps, or to specify the estimated κ candidate complex sinusoids as detected complex sinusoids. The threshold value can be determined using a penalty value which reduces the probability of overestimating the number of complex sinusoids.


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