The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Feb. 20, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventor:

Bo Sun, Carlsbad, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01); H03L 7/087 (2006.01); H03L 7/081 (2006.01);
U.S. Cl.
CPC ...
H03L 7/087 (2013.01); H03L 7/0812 (2013.01); H03L 2207/12 (2013.01);
Abstract

Multi-phase clock generation employing phase error detection between multiple delay circuit outputs in a controlled delay line to provide error correction is disclosed. A multi-phase clock generator is provided that includes a controlled delay line and a phase error detector circuit. Tap nodes are provided from outputs of one or more delay circuits in the controlled delay line. To detect and correct for phase errors in the controlled delay line, a phase detection circuit is provided that includes at least two phase detectors each configured to measure a phase offset error between tap nodes from the delay circuit(s) in the controlled delay line. These phase errors are then combined to create an error correction signal, which is used to control the delay of the delay circuit(s) in the controlled delay line to lock the phase of the output of the final delay circuit to an input reference clock signal.


Find Patent Forward Citations

Loading…