The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Nov. 11, 2016
Applicant:

Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;

Inventors:

Jaewook Nam, Seoul, KR;

Dongjae Kim, Taean-gun, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/10 (2006.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 5/10 (2013.01); G06T 7/60 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20024 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30136 (2013.01);
Abstract

There is provided a method for analyzing an image of rod-shaped particles, the method comprising: transforming a spatial domain image of rod-shaped particles having random orientations to a frequency domain image thereof using DFT (discrete Fourier transform); extracting connected components from the frequency domain image using a frequency domain filter, wherein the connected components have a predetermined orientation; and back-transforming the frequency domain image having the extracted connected components to a spatial domain image thereof using IDFT (inverse discrete Fourier transform).


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