The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Jul. 19, 2016
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A microscope () for generating a combined image () from multiple individual images (tototo) of an object () encompasses at least one illumination device () for illuminating the object () from at least two different illumination directions (); an image acquisition unit () for acquiring multiple individual images (tototo) of the object () illuminated from the at least two different illumination directions (); and an image combination unit () for combining the individual images (tototo) in order to obtain the combined image (). The image combination unit () is embodied to combine the individual images (tototo) so that an information loss connected with an image artifact of one of the individual images (tototo) is compensated for utilizing an image datum of at least one other of the individual images (tototo) in the combined image ().