The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Jul. 17, 2014
Nec Solution Innovators, Ltd., Koto-ku, Tokyo, JP;
Yasuyuki Ihara, Tokyo, JP;
Masashi Sugiyama, Tokyo, JP;
NEC SOLUTION INNOVATORS, LTD., Tokyo, JP;
Abstract
This invention relates to an attribute factor analysis method, which is a method of analyzing a factor of an attribute based on a training sample set including training samples each being a combination of reference image data and attribute data associated with the reference image data. The attribute factor analysis method includes: a division step of dividing an image region of the reference image data constituting each training sample of the training sample set into parts of a predetermined sample size in a mesh shape; a model construction step of constructing a regression model by performing sparse regression analysis for each of the parts based on the reference sample set; a dependency calculation step of calculating, with use of the regression model, for each training sample of the training sample set, a dependency between an explanatory variable representing a feature quantity of reference image data on each part and an objective variable representing the attribute data, to obtain an attribute factor analyzed result; and a visualization step of visualizing the attribute factor analyzed result to produce the visualized attribute factor analyzed result.