The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Jan. 26, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Gregory Louis Chappell, Luxembourg, LU;
Alexandros Zotos, Luxembourg, LU;
Sean Michael Gregory Corrigall, Luxembourg, LU;
Ben Jannis Freiberg, Trier, DE;
Petar Butkovic, Luxembourg, LU;
Vojtech Hordejcuk, Luxembourg, LU;
Giannis Skevakis, Luxembourg, LU;
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
The techniques described herein are directed to identifying data quality issues within information stored across multiple different data sources. For instance, the data quality issues can comprise missing values, inconsistent values, and un-translated values. Once identified, the techniques implement actions to resolve the data quality issues so that consumption or use of the information stored is improved. In at least one example, the identification and resolution of a data quality issue can be implemented in response to receiving a query that identifies an object. Based on the query, the system can collect values, from the multiple different sources, for attributes that have been defined for an item. The system can use algorithms (e.g., a comparison algorithm) to identify a data quality issue and can output a graphical user interface that visually distinguishes between attributes with a data quality issue and attributes without a data quality issue.