The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Aug. 03, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Mukul R. Prasad, San Jose, CA (US);

Hiroaki Yoshida, Cupertino, CA (US);

Ripon K. Saha, Santa Clara, CA (US);

Indradeep Ghosh, Cupertino, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

In some examples, a method to interactively repair a software program using one or more automatically generated tests with human-provided test oracles may include identifying a fault location in a software program, generating a potential repair at the fault location based on a repair candidate, automatically generating a first test to test the potential repair, and generating a first query for a first test oracle based on the first test. The method may also include obtaining a response to the first query from a human, generating a first human-provided test oracle based on the first query and the obtained response to the first query, augmenting a test suite to include the first automatically generated test with the first human-provided test oracle, and testing the potential repair using the augmented test suite including the first automatically generated test with the first human-provided test oracle.


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