The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Oct. 20, 2014
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Jayalakshmi Pattabiraman, Sunnyvale, CA (US);

Nikhil Mattankot, Sunnyvale, CA (US);

Deekshith Belchapada, Sullia Tq, IN;

Blake H. Lewis, Los Altos, CA (US);

Subramaniam Periyagaram, Campbell, CA (US);

Satya Suresh Chouta Naga Veera, Cupertino, CA (US);

Rohit Singh, Cary, NC (US);

Rajesh Khandelwal, Sunnyvale, CA (US);

James Robert Morefield, Fuquay Varina, NC (US);

Assignee:

NETAPP, INC., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 7/06 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0613 (2013.01); G06F 3/0616 (2013.01); G06F 3/0683 (2013.01); G06F 7/06 (2013.01); G06F 12/02 (2013.01);
Abstract

A first plurality of block identifiers is sorted based, at least in part, on a measure of spatial locality. A second plurality of block identifiers is sorted based, at least in part, on the measure of spatial locality. At least the first plurality of block identifiers and the second plurality of block identifiers are incrementally merged into a third plurality of block identifiers based, at least in part, on the measure of spatial locality. A block of data corresponding to metadata associated with a plurality of block identifiers of the third plurality of block identifiers is updated.


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