The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Mar. 07, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Marius Iosif Boamfa, Eindhoven, NL;
Reinhold Wimberger-Friedl, Eindhoven, NL;
Theodoor Bastiaan Johannes Haddeman, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to digital pathology. In order provide enhanced use of available imaging radiation, a digital pathology scanner () is provided that comprises a radiation arrangement (), a sample receiving device (), an optics arrangement (), and a sensor unit (). The radiation arrangement comprises a source () that provides electromagnetic radiation () for radiating a sample received by the sample receiving device. Further, the optics arrangement comprises at least one of the group of a lens () and a filter () that are arranged between the sample receiving device and the sensor unit. The sensor unit is configured to provide image data of the radiated sample. Still further, a lens array arrangement () is provided that comprises at least one lens array () arranged between the source and the sample receiving device. The at least one lens array comprises a plurality of linear cylindrical lenses () that modulate the electromagnetic radiation from the source such that, in an object plane, a radiation distribution pattern () is generated with a plurality of first parts of intensified radiation and a plurality of second parts of weak radiation.