The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Feb. 06, 2018
Applicant:

Siemens Medical Solutions Usa, Inc., Malvern, PA (US);

Inventors:

Johannes Breuer, Nürnberg, DE;

Maciej P. Kapusta, Knoxville, TN (US);

Matthias J. Schmand, Lenoir City, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01); G01T 1/2006 (2013.01); G01T 1/20 (2013.01);
Abstract

A radiation detector comprises a first scintillator having a first peak wavelength and a second scintillator positioned on the first scintillator. The second scintillator has a second peak wavelength different from the first peak wavelength. A plurality of photon detectors are provided. The first scintillator is positioned over and contacts each of the plurality of photon detectors. The plurality of photon detectors include first detectors and second detectors. The second detectors differ from the first detectors in doping profile, pn junction depth, or front-versus-backside illumination geometry. The first detectors are more sensitive to the first peak wavelength than the second peak wavelength. The second detectors are more sensitive to the second peak wavelength than the first detectors.


Find Patent Forward Citations

Breuer, Johannes. (2019). Radiation detector capable of measuring depth-of-interaction (U.S. Patent No. 10267931). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10267931

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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