The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Oct. 30, 2017
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Makoto Shuto, Tokyo, JP;

Kazuyoshi Kawai, Tokyo, JP;

Mitsuya Fukazawa, Tokyo, JP;

Robert Nolf, Buckinghamshire, GB;

Robert Dalby, Buckinghamshire, GB;

Assignee:

Renesas Electronics Corporation, Koutou-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01); G01R 19/252 (2006.01); H03G 3/20 (2006.01); H03H 17/06 (2006.01); H03M 1/38 (2006.01); H03M 3/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
G01R 21/133 (2013.01); G01R 19/252 (2013.01); H03G 3/20 (2013.01); H03H 17/0621 (2013.01); H03M 1/1205 (2013.01); H03M 1/38 (2013.01); H03M 3/458 (2013.01);
Abstract

There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.


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