The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Apr. 14, 2016
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Jun Wang, San Jose, CA (US);

Ruwan T. Kurulugama, Livermore, CA (US);

George Stafford, San Jose, CA (US);

Gregor T. Overney, San Jose, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01J 49/004 (2013.01); H01J 49/0031 (2013.01);
Abstract

In an ion mobility-mass spectrometry (IM-MS) system, an ion mass-isolated data set is acquired by operating a mass filter to apply a mass isolation window having an m/z width such that the mass isolation window moves through a sequence of window positions, each window position being defined by an IM drift time value and an m/z ratio value. The m/z width of the mass isolation window and the sequence of window positions are determined such that the mass isolation window captures ions in a region of interest of a larger all-ions data set. The isolation window may be a wideband isolation window. In comparison to the all-ions data set, the mass-isolated data set may yield reduced ion signal interference and increased selectivity for analytes of interest.


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