The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Nov. 02, 2015
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Xiaolei Jiang, Beijing, CN;
Xiaohua Zhu, Beijing, CN;
Xin Jin, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
The present disclosure relates to X-ray imaging systems and methods. An exemplary system may comprise a distributed X-ray source arrangement, a fixed grating module, an X-ray detecting device, and a computer workstation. In one illustrative implementation, X-ray sources of the distributed incoherent X-ray source arrangement may sequentially generate and emit X-rays to an object to be detected. Further, for each exposure, the X-ray detecting device may receive the X-rays, wherein after a series of stepping exposures and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve; the intensity curve may be compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel may be obtained from a variation of the intensity curves; and image information of the object to be detected may be obtained according to such pixel values.