The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Apr. 26, 2016
Applicants:

Illumina France Sarl, Paris, FR;

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Inventors:

Cyril Delattre, San Diego, CA (US);

Arnaud Rival, Paris, FR;

Cédric Allier, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1475 (2013.01); G01N 15/1463 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1481 (2013.01); G01N 2021/1765 (2013.01);
Abstract

In accordance with embodiments herein, microfluidics systems and methods are described for identifying and/or tracking particles in a droplet. For example, the particle may be a bead, a cell, or any other type of particle. For example, embodiments herein are useful in distinguishing cells from other particles. The microfluidics systems and methods provide the capability to image a large area (e.g., a few square millimeters) within a digital fluidics chamber using interference microscopy, wherein the image of the interference pattern is acquired, instead of an image of the micrometric object itself. The interference pattern results from the incoming light that interferes with the light scattered by the object. In the case of micrometric objects (e.g., cells, bacteria, etc.), the acquired interference pattern may typically be about 100 jum in diameter so that the area can be imaged using a lens-free imaging configuration or using a low magnification lens.


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