The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Dec. 19, 2014
Nuctech Company Limited, Beijing, CN;
Ziran Zhao, Beijing, CN;
Jianhong Zhang, Beijing, CN;
Hongqiu Wang, Beijing, CN;
Weiwei Wang, Beijing, CN;
Zhiming Wang, Beijing, CN;
Yumin Yi, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
Embodiments of the present invention provide a Raman spectroscopic inspection method, comprising the steps of: measuring a Raman spectrum of an object to be inspected successively to collect a plurality of Raman spectroscopic signals; superposing the plurality of Raman spectroscopic signals to form a superposition signal; filtering out a florescence interfering signal from the superposition signal; and identifying the object to be inspected on basis of the superposition signal from which the florescence interfering signal has been filtered out. By means of the above method, a desired Raman spectroscopic signal may be acquired by removing the interference caused by a florescence signal from a Raman spectroscopic inspection signal of the object. It may inspect correctly the characteristics of the Raman spectrum of the object so as to identify the object effectively.