The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Jan. 04, 2016
Applicant:

Mcube, Inc., San Jose, CA (US);

Inventors:

Sudheer S. Sridharamurthy, Milpitas, CA (US);

Tony Maraldo, San Jose, CA (US);

Zheng-Yao Sun, San Jose, CA (US);

Wenhua Zhang, San Jose, CA (US);

Te-Hsi Terrence Lee, San Jose, CA (US);

Sanjay Bhandari, San Jose, CA (US);

Joseph Rastegar, San Jose, CA (US);

Assignee:

mCube, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/5684 (2012.01); B81C 99/00 (2010.01);
U.S. Cl.
CPC ...
G01C 19/5684 (2013.01); B81C 99/003 (2013.01);
Abstract

A method for a MEMS device comprises determining in a computer system, a first driving signal for the MEMS device in response to a first time delay and to a base driving signal, applying the first driving signal to the MEMS device to induce the MEMS device to operate at a first frequency, determining a second driving signal for the MEMS device in response to a second time delay and to the base driving signal, applying the second driving signal to the MEMS device to induce the MEMS device to operate at a second frequency, determining a first quality factor associated with the MEMS device in response to the first frequency and the second frequency, determining a quality factor associated with the MEMS device in response to the first quality factor, and determining whether the quality factor associated with the MEMS device, exceeds a threshold quality factor.


Find Patent Forward Citations

Sridharamurthy, Sudheer. (2019). Method to test the quality factor of a mems gyroscope at chip probe (U.S. Patent No. 10267636). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10267636

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…