The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Jan. 26, 2018
Natera, Inc., San Carlos, CA (US);
Matthew Rabinowitz, San Francisco, CA (US);
Milena Banjevic, Los Altos Hills, CA (US);
Zachary Demko, San Francisco, CA (US);
David Johnson, San Francisco, CA (US);
Dusan Kijacic, Los Altos Hills, CA (US);
Dimitri Petrov, Stanford, CA (US);
Joshua Sweetkind-Singer, San Jose, CA (US);
Jing Xu, Jersey City, NJ (US);
Natera, Inc., San Carlos, CA (US);
Abstract
Disclosed herein is a system and method for increasing the fidelity of measured genetic data, for making allele calls, and for determining the state of aneuploidy, in one or a small set of cells, or from fragmentary DNA, where a limited quantity of genetic data is available. Poorly or incorrectly measured base pairs, missing alleles and missing regions are reconstructed using expected similarities between the target genome and the genome of genetically related individuals. In accordance with one embodiment, incomplete genetic data from an embryonic cell are reconstructed at a plurality of loci using the more complete genetic data from a larger sample of diploid cells from one or both parents, with or without haploid genetic data from one or both parents. In another embodiment, the chromosome copy number can be determined from the measured genetic data, with or without genetic information from one or both parents.