The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Mar. 28, 2016
Applicant:

Landa Corporation Ltd., Rehovot, IL;

Inventors:

Benzion Landa, Nes Ziona, IL;

Sagi Abramovich, Ra'anana, IL;

Galia Golodetz, Rehovot, IL;

Gregory Nakhmanovich, Rishon Lezion, IL;

Assignee:

LANDA CORPORATION LTD., Rehovot, unknown;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/005 (2006.01); C09D 11/30 (2014.01); B32B 3/10 (2006.01); B32B 5/02 (2006.01); C09D 11/322 (2014.01); C09D 125/08 (2006.01); C09D 125/14 (2006.01); B41F 16/00 (2006.01); C09D 11/107 (2014.01); G03G 15/14 (2006.01); D06Q 1/00 (2006.01); D06P 1/00 (2006.01); B05D 1/00 (2006.01); D06P 3/00 (2006.01);
U.S. Cl.
CPC ...
C09D 11/30 (2013.01); B32B 3/10 (2013.01); B32B 5/02 (2013.01); B41F 16/0006 (2013.01); B41J 2/0057 (2013.01); C09D 11/107 (2013.01); C09D 11/322 (2013.01); C09D 125/08 (2013.01); C09D 125/14 (2013.01); G03G 15/14 (2013.01); B05D 1/00 (2013.01); D06P 1/00 (2013.01); D06P 3/00 (2013.01); D06Q 1/00 (2013.01); Y10T 428/24802 (2015.01); Y10T 428/24934 (2015.01); Y10T 428/265 (2015.01); Y10T 428/31938 (2015.04);
Abstract

An ink film construction including: (a) a printing substrate; and (b) at least one ink film, fixedly adhered to a top surface of the printing substrate, the ink film having an upper film surface distal to the top surface of the substrate, wherein a surface concentration of nitrogen at the upper film surface exceeds a bulk concentration of nitrogen within the film, the bulk concentration measured at a depth of at least 30 nanometers below the upper film surface, and wherein a ratio of the surface concentration to the bulk concentration is at least 1.1 to 1.


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