The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Aug. 27, 2015
Applicant:

Nippon Soda Co., Ltd., Tokyo, JP;

Inventor:

Kazuo Ono, Ichihara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08G 59/62 (2006.01); C07C 37/84 (2006.01); C07C 39/15 (2006.01); C07D 233/64 (2006.01); C08G 59/40 (2006.01); C08G 59/56 (2006.01); C08G 59/50 (2006.01);
U.S. Cl.
CPC ...
C08G 59/621 (2013.01); C07C 37/84 (2013.01); C07C 39/15 (2013.01); C07D 233/64 (2013.01); C08G 59/40 (2013.01); C08G 59/5073 (2013.01); C08G 59/56 (2013.01); C08G 59/62 (2013.01); C07B 2200/13 (2013.01);
Abstract

It is to provide a more stable crystal polymorph of a clathrate compound consisting of 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane and 2-phenyl-4-methyl-5-hydroxymethylimidazole (molar ratio 1:2). A novel crystal polymorph of a clathrate compound, consisting of 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane and 2-phenyl-4-methyl-5-hydroxymethylimidazole (molar ratio 1:2) and has diffraction peaks at diffraction angles (2θ) of 11.20°, 13.36°, 14.36°, 18.16°, 19.20°, 19.68°, 20.84°, 21.48°, 22.56°, 23.76° and 24.08° in a powder X-ray diffraction pattern as measured using a CuKα ray, can be obtained by, for example, further recrystallizing a crystal obtained by a conventionally known method or the like.


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