The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Apr. 28, 2016
Applicant:
President and Fellows of Harvard College, Cambridge, MA (US);
Inventors:
Wesley Philip Wong, Cambridge, MA (US);
Kenneth Anders Halvorsen, Glenmont, NY (US);
Assignee:
President and Fellows of Harvard College, Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B04B 15/00 (2006.01); G01N 33/543 (2006.01); G01N 21/17 (2006.01); G01N 15/14 (2006.01); G06T 7/20 (2017.01); G01N 11/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
B04B 15/00 (2013.01); G01N 15/1463 (2013.01); G01N 21/17 (2013.01); G01N 33/54313 (2013.01); G01N 33/54373 (2013.01); G06T 7/20 (2013.01); G01N 11/00 (2013.01); G01N 2015/0065 (2013.01); G01N 2203/0089 (2013.01);
Abstract
An apparatus for measuring a characteristic of a sample includes a sample measurement apparatus (), which includes a light source () configured to illuminate the sample; and a detector () configured to receive light from the sample. The sample measurement apparatus is sized and dimensioned to fit within a centrifuge receptacle, the centrifuge receptacle () coupled to a spindle configured to rotate the centrifuge receptacle to apply a force to the sample.