The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Dec. 29, 2015
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Hideto Yamashita, Suwa, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
A61B 5/681 (2013.01); A61B 5/02416 (2013.01); A61B 5/02427 (2013.01); A61B 5/02438 (2013.01); A61B 5/721 (2013.01); A61B 2560/0412 (2013.01);
Abstract
A biological information measuring device includes a sensor unit as a biological information measuring module. The sensor unit includes a substrate as a support portion that has a support surface and supports a light receiving portion and a second wall portion as a frame on the support surface. Assuming that the width of the second wall portion is L, a difference Δh between a height h from the support surface to the top surface of the light receiving portion and a height H from the support surface to the top surface of the second wall portion is expressed by Expression (1):