The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10264993 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 23, 2019

Filed:

Jun. 21, 2007
Applicants:

Erin Claude Looney, Reno, NV (US);

David James Harra, San Francisco, CA (US);

Inventors:

Erin Claude Looney, Reno, NV (US);

David James Harra, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); A61B 5/05 (2006.01); G06F 19/00 (2018.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01); G06F 19/12 (2011.01);
U.S. Cl.
CPC ...
A61B 5/05 (2013.01); A61B 5/0507 (2013.01); A61B 5/14532 (2013.01); A61B 5/411 (2013.01); G06F 19/701 (2013.01); G06F 19/12 (2013.01);
Abstract

A system and methods for scanning and analyzing one or more characteristics of a sample utilizing electromagnetic radiation is described. More particularly, the system and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample to be analyzed is placed between the transmitter and receiver and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets, which are developed into a composite spectrogram by the analyzer and processed to determine one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications and to make other characteristic analysis applications possible. Samples include inert and living items and the characteristics include a wide variety of different applications. Although pattern recognition is utilized in some applications to match a present composite spectrogram with previously detected spectrograms, the present composite spectrogram can also be analyzed based on pattern components to make characteristic determinations without per-use calibration and without utilizing any pattern matching.


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