The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2019

Filed:

Sep. 06, 2016
Applicant:

Tomey Corporation, Nagoya-shi, JP;

Inventors:

Shigeyoshi Yamamoto, Nagoya, JP;

Guangchun Bian, Nagoya, JP;

Assignee:

Tomey Corporation, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/15 (2006.01); A61B 3/16 (2006.01); A61B 3/18 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/18 (2013.01); A61B 3/0091 (2013.01); A61B 3/103 (2013.01); A61B 3/152 (2013.01); A61B 3/16 (2013.01); A61B 3/165 (2013.01);
Abstract

An ophthalmic device is configured to examine at least two eye characteristics including intraocular pressure, and the ophthalmic device includes: an examination optical system configured to obtain information of a subject's eye when the at least two eye characteristics of the subject's eye are examined; and an examination window configured to switch examinations of the at least two eye characteristics. The examination optical system is arranged outside of the examination window. The examination window is capable of rotating independently of the examination optical system. The examinations of the at least two eye characteristics are switched by rotation of the examination window.


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