The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Sep. 04, 2014
Applicant:

Nitto Denko Corporation, Osaka, JP;

Inventors:

Terukazu Ihara, Ibaraki, JP;

Kouji Ichinose, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 3/40 (2006.01); G01R 31/28 (2006.01); G11B 5/455 (2006.01); H05K 1/02 (2006.01); G11B 5/48 (2006.01); H05K 1/11 (2006.01); H05K 3/46 (2006.01);
U.S. Cl.
CPC ...
H05K 3/4038 (2013.01); G01R 31/2805 (2013.01); G01R 31/2813 (2013.01); G11B 5/455 (2013.01); H05K 1/0268 (2013.01); G11B 5/484 (2013.01); H05K 1/115 (2013.01); H05K 1/116 (2013.01); H05K 3/4685 (2013.01); H05K 2201/0939 (2013.01); H05K 2201/09381 (2013.01); Y10T 29/49004 (2015.01);
Abstract

First and second measurement probes come into contact with first and second electrode pads, respectively, and third and fourth measurement probes come into contact with the first and second electrode pads, respectively. A current flows in a current path including the first and second electrode pads and a plurality of lines through the first and second measurement probes. A value of the current in the current path is measured, and a value of a voltage between the third and fourth measurement probes is measured. Conductivity between the first and second electrode pads is inspected based on the measured value of the current and the measured value of the voltage.


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