The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Jun. 29, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Myungjae Jeon, Yongin-si, KR;

Yonghwa Park, Yongin-si, KR;

Jangwoo You, Seoul, KR;

Yongchul Cho, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01S 17/08 (2006.01); G01S 17/89 (2006.01); H04N 13/271 (2018.01); H04N 13/207 (2018.01); H04N 13/254 (2018.01); H04N 13/296 (2018.01); G01S 17/36 (2006.01); G01S 7/481 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G01S 7/4816 (2013.01); G01S 7/497 (2013.01); G01S 17/08 (2013.01); G01S 17/36 (2013.01); G01S 17/89 (2013.01); H04N 13/207 (2018.05); H04N 13/254 (2018.05); H04N 13/296 (2018.05);
Abstract

A depth image generating apparatus includes a light source configured to emit light; an optical shutter provided on a path of the light reflected by an object and configured to modulate a waveform of the reflected light by changing a transmissivity of the optical shutter with respect to the reflected light; a driver configured to apply a driving voltage to the light source and a driving voltage to the optical shutter; a temperature measurer configured to measure a temperature of the optical shutter; a controller configured to control driving voltages; and a depth information obtainer configured to generate an image corresponding to the reflected light that passes through the optical shutter, extract a phase difference between a phase of the light emitted by the light source to the object and a phase of the reflected light, and obtain depth information regarding the object based on the phase difference.


Find Patent Forward Citations

Loading…