The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2019

Filed:

Oct. 19, 2015
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Marc Holness, Kanata, CA;

Cory Gordon, Spokane Valley, WA (US);

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/939 (2013.01);
U.S. Cl.
CPC ...
H04L 43/0835 (2013.01); H04L 43/0841 (2013.01); H04L 43/10 (2013.01); H04L 49/552 (2013.01);
Abstract

A method for measuring frame loss on a connection between a near-device (NED) and a far-end device (FED). The method includes: placing, on the connection, multiple test frames having a plurality of sequence numbers; obtaining, from the connection, a first reflected test frame having a first sequence number, a first FED receiving counter value from the FED, and an initial FED received count from the FED; obtaining, from the connection, a second reflected test frame having a second sequence number, a second FED receiving counter value from the FED, and the initial FED received count from the FED; and calculating a one-way frame loss value on the connection based on the second sequence number and the initial FED received count.


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